Ion-beam analysis provides a direct way to quantify the elemental composition of a sample through its sensitivity to the atomic nucleus. The results remain untouched by the chemical state and surroundings, the so-called matrix effect, yielding a superior reproducibility and accuracy. Furthermore, only minimal sample preparation will be required.

Consequently, ion-beam analysis (IBA) offers an alternative method to established methods such as ICP-OES, ICP-MS and electron microprobes (EPMA, EDX, TEM) or secondary-ion mass-spectrometry (SIMS). In comparison to ICP methods IBA offers up to 10 times higher throughput due to the elimination of preparation steps. In comparison to electron microprobes IBA offers high sensitivity to light elements such as B or Li and lower detection limits for all elements, at the expense of a slightly worse lateral resolution. In comparison to SIMS, IBA remains non-destructive and yields absolute elemental quantities, but with a slightly worse depth resolution.

Below you can find our workflow video demonstrating how to operate the device and how to extract the results.

Aachen Ion Beams UG
MeV ion µ-beam analysis by RBS, NRA, ERD, PIXE, and PIGE, irradiation technologies, engineering services